Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/51325
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dc.contributor.author王行健zh_TW
dc.contributor.other中興大學資訊科學研究所zh_TW
dc.contributor.other行政院國家科學委員會zh_TW
dc.date2000zh_TW
dc.date.accessioned2014-06-06T08:54:10Z-
dc.date.available2014-06-06T08:54:10Z-
dc.identifierNSC88-2215-E005-003zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/51325-
dc.language.isozh_TWzh_TW
dc.relation.urihttp://grbsearch.stpi.narl.org.tw/GRB/result.jsp?id=428438&plan_no=NSC88-2215-E005-003&plan_year=88&projkey=PB8802-0167&target=plan&highStr=*&check=0&pnchDesc=%E7%8F%BE%E5%A0%B4%E5%8F%AF%E7%A8%8B%E5%BC%8F%E9%82%8F%E8%BC%AF%E9%99%A3%E5%88%97%E9%96%98%E4%B8%AD%E4%B9%8B%E9%8C%AF%E8%AA%A4%E8%A8%BA%E6%96%B7en_US
dc.subject資訊科學--軟體zh_TW
dc.subject場可程式閘列zh_TW
dc.subjectField-programmable gate array (FPGA)en_US
dc.subject錯誤診斷zh_TW
dc.subject內建自我測試zh_TW
dc.subject自動測試設備zh_TW
dc.subject基礎研究zh_TW
dc.subjectFault diagnosisen_US
dc.subjectBuilt-in self-test (BIST)en_US
dc.subjectAutomatic testing equipment (ATE)en_US
dc.title現場可程式邏輯陣列閘中之錯誤診斷zh_TW
dc.titleFault Diagnosis in Filed-Programmable Gate Arraysen_US
dc.typeResearch Reportszh_TW
item.fulltextno fulltext-
item.languageiso639-1zh_TW-
item.openairetypeResearch Reports-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
Appears in Collections:資訊科學與工程學系所
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