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標題: 現場可程式邏輯陣列閘中之錯誤診斷
Fault Diagnosis in Filed-Programmable Gate Arrays
作者: 王行健
關鍵字: 資訊科學--軟體;場可程式閘列;Field-programmable gate array (FPGA);錯誤診斷;內建自我測試;自動測試設備;基礎研究;Fault diagnosis;Built-in self-test (BIST);Automatic testing equipment (ATE)
其他識別: NSC88-2215-E005-003
Appears in Collections:資訊科學與工程學系所

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