Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/56512
DC FieldValueLanguage
dc.contributor.author蔡順仁zh_TW
dc.contributor.author鄒箎生zh_TW
dc.contributor.other行政院國家科學委員會zh_TW
dc.contributor.other中興大學食品科學系zh_TW
dc.date1994zh_TW
dc.date.accessioned2014-06-06T09:06:09Z-
dc.date.available2014-06-06T09:06:09Z-
dc.identifierNSC82-0406-E005-030zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/56512-
dc.description.abstract目的:以近紅外線分光術探討大豆於貯藏過程 中之品質劣變作用機制.材料:搜集不同品種之大豆樣品,於80%RH(相對溫度) 及30□溫度下貯藏.方法:利用近紅外線分光掃描貯藏過之大豆樣品, 波長範圍400.sim. 2500nm,以電腦分析大豆在貯藏過 程中光譜之變化情形,由變化較大的波長,推測品 質劣變過程中之化學鏈結變化,及成分變化,提出 劣變作用可能之機制,並以傳統生化法加以印證.預期結果:�瞭解不同來源之大豆原料及經貯藏後之成分變 化,建立大豆之劣變作用資料.�根據大豆劣變過程之近紅外線光譜,提出劣變 作用機制之模式.zh_TW
dc.language.isozh_TWzh_TW
dc.relation.urihttp://grbsearch.stpi.narl.org.tw/GRB/result.jsp?id=63433&plan_no=NSC82-0406-E005-030&plan_year=82&projkey=PB8204-2050&target=plan&highStr=*&check=0&pnchDesc=%E4%BB%A5%E8%BF%91%E7%B4%85%E5%A4%96%E7%B7%9A%E5%88%86%E5%85%89%E8%A1%93%E6%8E%A2%E8%A8%8E%E5%A4%A7%E8%B1%86%E5%93%81%E8%B3%AA%E5%8A%A3%E8%AE%8A%E4%BD%9C%E7%94%A8%E6%A9%9F%E5%88%B6%E4%B8%A6%E9%A0%90%E4%BC%B0%E5%8A%A0%E5%B7%A5%E5%93%81%E8%B3%AA%E5%8F%AF%E8%A1%8C%E6%80%A7%E4%B9%8B%E7%A0%94%E7%A9%B6+%28II%29en_US
dc.subject應用研究zh_TW
dc.subjectNear infrared reflectance spectroscopyen_US
dc.subject食品科技zh_TW
dc.subject近紅外線分光術zh_TW
dc.subject大豆zh_TW
dc.subject品質劣變zh_TW
dc.subject豆腐zh_TW
dc.subjectSoybeanen_US
dc.subjectQuality deteriorationen_US
dc.subjectTofuen_US
dc.title以近紅外線分光術探討大豆品質劣變作用機制並預估加工品質可行性之研究 (II)zh_TW
dc.titleStudies on Mechanism of Soybean Quality Deterioration and Evaluation of Soyprotein Quality by Near Infrared Reflectance Spectrocopy (III)en_US
dc.typeResearch Reportszh_TW
item.grantfulltextnone-
item.openairetypeResearch Reports-
item.cerifentitytypePublications-
item.languageiso639-1zh_TW-
item.fulltextno fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
Appears in Collections:食品暨應用生物科技學系
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