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標題: (IEEE Proceedings of VLSI Test Symposium, p246-p251)An Efficient BIST Method for Small Buffers
作者: W. B. Jone
D. C. Huang 
S. C. Wu
K. J. Lee
關鍵字: BIST Method;Small Buffers
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Proceedings of VLSI Test Symposium, Page(s) 246-251.
Appears in Collections:資訊科學與工程學系所

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