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標題: (IEEE Asian Test Symposium 2000, p299-p303)An Efficient Parallel Transparent Diagnostic BIST
作者: D. C. Huang 
W. B. Jone
關鍵字: Memory Test;Built-In Self-Diagnosis;Transparent diagnosis
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Asian Test Symposium 2000:299-303
Appears in Collections:資訊科學與工程學系所

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