Please use this identifier to cite or link to this item:
http://hdl.handle.net/11455/60234
標題: | (IEEE Asian Test Symposium 2000, p299-p303)An Efficient Parallel Transparent Diagnostic BIST | 作者: | D. C. Huang W. B. Jone |
關鍵字: | Memory Test;Built-In Self-Diagnosis;Transparent diagnosis | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Asian Test Symposium 2000:299-303 | URI: | http://hdl.handle.net/11455/60234 |
Appears in Collections: | 資訊科學與工程學系所 |
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