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http://hdl.handle.net/11455/60235
標題: | (IEEE Proceedings of the 14th International Conference on VLSI Design, p397-p402)A Parallel Built-In Self-Diagnostic Method for Embedded Memory Buffers | 作者: | D. C. Huang W. B. Jone S. R. Das |
關鍵字: | Memory Diagnosis;Built-In Self-Diagnosis;Serial Interface Technique;March Operations;Memory Fault Model | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Proceedings of the 14th International Conference on VLSI Design, Page(s) 397-402. | URI: | http://hdl.handle.net/11455/60235 |
Appears in Collections: | 資訊科學與工程學系所 |
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