Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/60235
標題: (IEEE Proceedings of the 14th International Conference on VLSI Design, p397-p402)A Parallel Built-In Self-Diagnostic Method for Embedded Memory Buffers
作者: D. C. Huang 
W. B. Jone
S. R. Das
關鍵字: Memory Diagnosis;Built-In Self-Diagnosis;Serial Interface Technique;March Operations;Memory Fault Model
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Proceedings of the 14th International Conference on VLSI Design, Page(s) 397-402.
URI: http://hdl.handle.net/11455/60235
Appears in Collections:資訊科學與工程學系所

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