DSpace CRIS
DSpace-CRIS consists of a data model describing objects of interest to Research and Development and a set of tools to manage the data. Standard DSpace is used to deal with publications and data sets, whereas DSpace-CRIS involves other CRIS entities: Researcher Pages, Projects, Organization Units and Second Level Dynamic Objects (single entities specialized by a profile, such as Journal, Prize, Event etc; because any profile can define its own set of properties and nested objects)
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http://hdl.handle.net/11455/60238| 標題: | (IEEE Instrumentation and Measurement Technology Conference, p601-p606)An Efficient BIST Method for Non-Traditional Faults of Embedded Method Arrays | 作者: | W. B. Jone D. C. Huang S. R. Das |
關鍵字: | Embedded Memory Array Test;Bulit-In Self-Testing;Read-Sensitive Faults;Serial Interface Technique;SOC Testing | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Instrumentation and Measurement Technology Conference, Page(s) 601-606. | URI: | http://hdl.handle.net/11455/60238 |
| Appears in Collections: | 資訊科學與工程學系所 |
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