Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/60238
標題: (IEEE Instrumentation and Measurement Technology Conference, p601-p606)An Efficient BIST Method for Non-Traditional Faults of Embedded Method Arrays
作者: W. B. Jone
D. C. Huang 
S. R. Das
關鍵字: Embedded Memory Array Test;Bulit-In Self-Testing;Read-Sensitive Faults;Serial Interface Technique;SOC Testing
出版社: USA: IEEE Circuits and Systems Society
Project: IEEE Instrumentation and Measurement Technology Conference, Page(s) 601-606.
URI: http://hdl.handle.net/11455/60238
Appears in Collections:資訊科學與工程學系所

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