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http://hdl.handle.net/11455/60239| 標題: | (IEEE Instrumentation and Measurement Technology Conference, p700-p705)A Parallel Built-In Self-Diagnostic Method for Non-Traditional Faults of Embedded Memory Arrays | 作者: | V. Arora W. B. Jone D. C. Huang S. R. Das |
關鍵字: | Built-In Self-Diagnostic Method;Non-Traditional Faults;Embedded Memory Arrays | 出版社: | USA: IEEE Circuits and Systems Society | Project: | IEEE Instrumentation and Measurement Technology Conference, Page(s) 700-705. | URI: | http://hdl.handle.net/11455/60239 |
| Appears in Collections: | 資訊科學與工程學系所 |
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