Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/66802
DC FieldValueLanguage
dc.contributor蔡坤旺zh_TW
dc.contributor.author戴慶良zh_TW
dc.contributor.authorDAI, CHING LIANGen_US
dc.contributor.author彭宣榕zh_TW
dc.date2008-09zh_TW
dc.date.accessioned2014-06-11T05:49:32Z-
dc.date.available2014-06-11T05:49:32Z-
dc.identifier.urihttp://hdl.handle.net/11455/66802-
dc.description.abstract本發明係關於一種微機電(Micro electro mechanical system, MEMS)元件之製造方法,可藉由CMOS製程及以介電層為犧牲層獲得。本發明方法主要為先形成一元件層於一基板上,該元件層之下層中央部分為訊號傳輸線,兩端為接地端;元件層之上層為金屬薄膜,該訊號傳輸線與金屬薄膜之間為介電層。本發明以介電層為犧牲層,將其蝕刻後,即可釋放金屬薄膜,製成電容式射頻開關或其他元件。zh_TW
dc.language.isozh_TWzh_TW
dc.relation.urihttp://twpat.tipo.gov.tw/tipotwoc/tipotwkmen_US
dc.title微機電元件之製造方法zh_TW
dc.typePatentzh_TW
item.openairetypePatent-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1zh_TW-
item.grantfulltextnone-
item.fulltextno fulltext-
item.cerifentitytypePublications-
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