Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/67654
標題: Characterization of the microstructure and phase formation in the Au-In system using transmission electron microscopy
作者: Chang, Z.C.
呂福興
Lu, F.H.
Shieu, F.S.
薛富盛
關鍵字: growth mechanism;intermetallic;microstructure;transmission electron;microscopy;au(111) surface;temperature;adsorption
Project: Materials Chemistry and Physics
期刊/報告no:: Materials Chemistry and Physics, Volume 70, Issue 2, Page(s) 137-143.
摘要: 
The Au-In system is of both fundamental and technical importance for engineering applications such as microelectronic packaging. The growth mechanism and crystal orientation of the Au and In thin films produced by thermal evaporation on NaCl substrates are studied by transmission electron microscopy (TEM). Like most metals, the growth of both Au and In thin films on single crystals of NaCl follows the Volmer-Weber mode, i.e. formation of metal nuclei first, and then grain growth and coalescence of the particles to form a continuous thin film. In contrast, the growth of In on the An-coated NaCl substrates follows the Frank-van der Merwe mode, i.e. layer by layer, as a result of strong interactions between Au and In. The formation of AuIn2 phase occurs instantly upon In deposition, and the intermetallic exhibits an epitaxial orientation to the underlayer Au single crystals. In addition, cross-section TEM observation of the Au/In/Au thin sections by ultramicrotomy shows that the AuIn2 intermetallic is brittle. (C) 2001 Elsevier Science B.V. All rights reserved.
URI: http://hdl.handle.net/11455/67654
ISSN: 0254-0584
DOI: 10.1016/s0254-0584(00)00485-5
Appears in Collections:工學院

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