Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/68053
標題: Tailoring interfacial exchange coupling with low-energy ion beam bombardment: Tuning the interface roughness
作者: Lin, K.W.
Mirza, M.
Shueh, C.
Huang, H.R.
Hsu, H.F.
van Lierop, J.
關鍵字: ferromagnetic/antiferromagnetic bilayers;nio/nife bilayers;bias;nio;temperature;anisotropy;systems;model
Project: Applied Physics Letters
期刊/報告no:: Applied Physics Letters, Volume 100, Issue 12.
摘要: 
By ascertaining NiO surface roughness in a Ni80Fe20/NiO film system, we were able to correlate the effects of altered interface roughness from low-energy ion-beam bombardment of the NiO layer and the different thermal instabilities in the NiO nanocrystallites. From experiment and by modelling the temperature dependence of the exchange bias field and coercivity, we have found that reducing the interface roughness and changing the interface texture from an irregular to striped conformation enhanced the exchange coupling strength. Our results were in good agreement with recent simulations using the domain state model that incorporated interface mixing. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3697405]
URI: http://hdl.handle.net/11455/68053
ISSN: 0003-6951
DOI: 10.1063/1.3697405
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