Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69136
標題: Characterization of on-chip transformer using microwave technique
作者: Hsu, H.M.
Tseng, C.W.
Chan, K.Y.
關鍵字: figure-of-merit;gain loci;impedance matching;on-chip transformer;power gain;S-parameter;spiral inductors;cmos
Project: Ieee Transactions on Electron Devices
期刊/報告no:: Ieee Transactions on Electron Devices, Volume 55, Issue 3, Page(s) 833-837.
摘要: 
The figure-of-merit of an on-chip transformer is investigated by using a power gain approach in this paper. Adopting a microwave viewpoint, contrary to the lumped-circuit concept, to characterize the on-chip transformer, the transfer power gain between primary and secondary terminals is plotted in the Smith chart by changing the load impedances. Therefore, the peak value of power gain is found at a specific load impedance. To discuss the power loss of two transformers with different metal widths, the device layouts are carefully designed to maintain identical self- and mutual inductances in the transformers' coils. Results show that impedance matching plays a key role in improving the power gain of an on-chip transformer.
URI: http://hdl.handle.net/11455/69136
ISSN: 0018-9383
DOI: 10.1109/ted.2007.914841
Appears in Collections:期刊論文

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