Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69162
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dc.contributor.authorKao, M.C.en_US
dc.contributor.authorChen, H.Z.en_US
dc.contributor.authorYoung, S.L.en_US
dc.contributor.authorChiang, J.L.en_US
dc.contributor.authorLin, C.C.en_US
dc.contributor.authorKung, C.Y.en_US
dc.contributor.authorLin, C.H.en_US
dc.contributor.authorLiao, C.C.en_US
dc.date2011zh_TW
dc.date.accessioned2014-06-11T05:57:56Z-
dc.date.available2014-06-11T05:57:56Z-
dc.identifier.issn0018-9464zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/69162-
dc.description.abstractBi0.9Eu0.1FeO3 (BEFO) thin films were deposited on Pt(111)/Ti/SiO2/Si(100) substrates using the sol-gel method and rapid thermal annealing in an oxygen atmosphere. The effects of annealing temperature (400 similar to 700 degrees C) on microstructure and multiferroic properties of thin films were investigated. The X-ray diffraction analysis showed that the BEFO thin films had an orthorhombic structure. The thin films showed ferroelectric and ferromagnetic properties with remanent polarization (2P(r)) of 15 mu C/cm(2) and remnant magnetization (2Mr) of 4.2 emu/g. The leakage current density (J) of the BEFO thin film annealed at 700 degrees C was 4.25 x 10(-8) A/cm(2) at 150 kV/cm. The leakage current was affected not only by the microstructure but also by the interface between the Pt electrode and the BEFO thin films. Moreover, it was found that more than one conduction mechanism was involved in the electric field range used in these experiments. In the low electric field region, the leakage current was controlled by Poole-Frenkel emission. However, the mechanism could be explained by Schottky emission from the Pt electrode in the high electric field region.en_US
dc.language.isoen_USzh_TW
dc.relationIeee Transactions on Magneticsen_US
dc.relation.ispartofseriesIeee Transactions on Magnetics, Volume 47, Issue 10, Page(s) 2784-2787.en_US
dc.relation.urihttp://dx.doi.org/10.1109/tmag.2011.2156764en_US
dc.subjectBismuth ferriteen_US
dc.subjectleakage currenten_US
dc.subjectmagneticen_US
dc.subjectmultiferroicen_US
dc.subjectmagnetic-propertiesen_US
dc.titleMultiferroic Properties and Leakage Current Mechanisms of Bi0.9Eu0.1FeO3 Thin Filmsen_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1109/tmag.2011.2156764zh_TW
item.fulltextno fulltext-
item.languageiso639-1en_US-
item.openairetypeJournal Article-
item.cerifentitytypePublications-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.grantfulltextnone-
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