Please use this identifier to cite or link to this item:
|標題:||Characteristics and optical properties of Ni nanograins reduced on TiO2 film||作者:||Huang, H.H.
|關鍵字:||Ni nanoparticle;visible-light absorption shift;transmittance;e-beam;evaporation;morphology;chemical-vapor-deposition;thin-films;partial oxidation;metal;catalysts;methane;photocatalysts;temperature;particles;substrate||Project:||Japanese Journal of Applied Physics||期刊/報告no：:||Japanese Journal of Applied Physics, Volume 47, Issue 1, Page(s) 764-767.||摘要:||
NiO/TiO2 films with various NiO film thicknesses ranging from 10 to 320 nm were deposited on silicon and glass substrates by e-beam evaporation at 200 degrees C, and then annealed in H-2 atmosphere at 500 degrees C for 1 h in order to reduce the NiO film to Ni grains on the TiO2 film. The structures of titanium oxide, NiO, and Ni/TiO2 were determined by X-ray diffraction (XRD) analysis, and the morphology of the Ni/TiO2 films was observed by scanning probe microscopy. The ultraviolet-visible (UV-vis) transmittance and vis absorption of the Ni/TiO2 films were measured by UV-vis spectrophotometry. The results showed that an amorphous titanium oxide was obtained as deposited at 200 degrees C and that the structure change to the anatase phase after 500 degrees C annealing. As deposited, crystalline NiO films with XRD patterns similar to that of powder were obtained; however, diffraction peaks of (111) and (200) Ni appeared after annealing in H-2 atmosphere. Ni nanograins, coarsened grains, and films were obtained on the TiO2 films when the NiO film with a thickness from 10 to 320 nm was reduced in H-2 atmosphere at 500 degrees C. The transmittance of the Ni/TiO2 films decreased with an increase in Ni particle size. The vis absorption measurement showed that the peak shifted toward a shorter wavelength with a decrease in Ni particle size.
|Appears in Collections:||期刊論文|
Show full item record
TAIR Related Article
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.