Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69579
DC FieldValueLanguage
dc.contributor.authorChieh, J.J.en_US
dc.contributor.authorLin, I.S.en_US
dc.contributor.authorYang, S.Y.en_US
dc.contributor.authorHorng, H.E.en_US
dc.contributor.authorHong, C.Y.en_US
dc.contributor.authorYang, H.C.en_US
dc.date2009zh_TW
dc.date.accessioned2014-06-11T05:58:32Z-
dc.date.available2014-06-11T05:58:32Z-
dc.identifier.issn0021-4922zh_TW
dc.identifier.urihttp://hdl.handle.net/11455/69579-
dc.description.abstractA superconducting-qantum-interference-device (SQUID) nondestructive evaluation (NDE) system using a small room-temperature probe is developed for active scanning rather than for a massive movement occurring in a traditional SQUID NDE system. The small room-temperature probe is composed of a quadruple excitation coil and a double D-shaped pickup coil. It is connected to the input coil surrounding a high-T(c) rf SQUID, immersed in liquid nitrogen, and shielded by a shielding can. Beyond the NDE function, the SQUID NDE scheme has spatial recognition functions, including the detection of the orientation and depth of a narrow line crack using different parameters, and the scanning of images of large objects with arbitrary shapes. Furthermore, the spatial sensitivity, limited by the size of the probe, reaches up to only 7 mu m in the aspect of crack widths and 1 mm in the aspect of spatial intervals for precision NDE on a printed circuit board. (C) 2009 The Japan Society of Applied Physicsen_US
dc.language.isoen_USzh_TW
dc.relationJapanese Journal of Applied Physicsen_US
dc.relation.ispartofseriesJapanese Journal of Applied Physics, Volume 48, Issue 12.en_US
dc.relation.urihttp://dx.doi.org/10.1143/jjap.48.126506en_US
dc.subjectt-c squiden_US
dc.subjectnormal pickup coilen_US
dc.subjectunshielded environmenten_US
dc.subjectnde applicationen_US
dc.subjecthts-squiden_US
dc.subjectflawsen_US
dc.subjectresolutionen_US
dc.subjectsamplesen_US
dc.titleSpatial Recognition of a Superconducting Quantum Interference Devices Nondestructive Evaluation System Using a Small Room-Temperature Probeen_US
dc.typeJournal Articlezh_TW
dc.identifier.doi10.1143/jjap.48.126506zh_TW
item.cerifentitytypePublications-
item.grantfulltextnone-
item.languageiso639-1en_US-
item.fulltextno fulltext-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypeJournal Article-
Appears in Collections:期刊論文
Show simple item record
 

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.