Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/69709
標題: Pt/Co (4)/NiO thin film perpendicular magnetic anisotropy dependence on Co layer thickness
作者: Lin, K.W.
Volobuev, V.V.
Guo, J.Y.
Chung, S.H.
Ouyang, H.
van Lierop, J.
關鍵字: exchange bias;multilayers
Project: Journal of Applied Physics
期刊/報告no:: Journal of Applied Physics, Volume 107, Issue 9.
摘要: 
We have examined the dependence of the magnetism from perpendicular magnetic anisotropy with Co thickness in [Pt/Co] multilayers coupled to a NiO layer. We measure a perpendicular exchange bias field that changes polarity with Co thickness and find that with 2 nm of Co the perpendicular magnetic anisotropy is no longer present. Further evidence of the change in the Co layers preferred orientation is offered by zero field cooled susceptometry, where the low temperature susceptibility is negative for thin Co layers (0.9-1.2 nm) and becomes positive with increasing Co thickness (1.5-2.0 nm). Thin Co layered films also exhibit a compensation point around 100 K. These results indicate that the Co and NiO interface moments are coupled strongly and that there is competition between Pt/Co and Co/Ni at the film layer interfaces that sets the overall anisotropy from perpendicular and parallel configurations. (C) 2010 American Institute of Physics. [doi:10.1063/1.3340511]
URI: http://hdl.handle.net/11455/69709
ISSN: 0021-8979
DOI: 10.1063/1.3340511
Appears in Collections:期刊論文

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