Please use this identifier to cite or link to this item: http://hdl.handle.net/11455/70202
標題: Microstructures and Magnetic Anisotropy of Single-Layered Fe-Pt Alloy Films by In-Situ Annealing
作者: Sun, T.H.
Chen, S.C.
Lin, Y.C.
Ou, S.L.
Chen, J.R.
關鍵字: Single-Layered Fe-Pt Films;In-Situ Annealing;Substrate Temperature;Perpendicular Magnetic Anisotropy;granular thin-films;thickness;dependence;coercivity
Project: Journal of Nanoscience and Nanotechnology
期刊/報告no:: Journal of Nanoscience and Nanotechnology, Volume 12, Issue 2, Page(s) 1440-1443.
摘要: 
The single-layered Fe-Pt films with thickness of 30 nm are in-situ deposited directly on Si substrate at various substrate temperatures (T-s) of 350 to 590 degrees C. As the Fe-Pt film is sputtered at substrate temperature is 350 degrees C, it shows (111) preferred orientation and tends to in-plane magnetic anisotropy. The L1(0) Fe-Pt film with (001) texture is obtained and exhibited perpendicular magnetic anisotropy as the substrate temperature is increased to 470 degrees C. The perpendicular coercivity (Hc(perpendicular to)) saturation magnetization (Ms) and perpendicular squareness (S-perpendicular to) of this film are 6.9 kOe, 674 emu/cm(3) and 0.89, respectively, which reveal its significant potential as perpendicular magnetic recording media.
URI: http://hdl.handle.net/11455/70202
ISSN: 1533-4880
DOI: 10.1166/jnn.2012.4670
Appears in Collections:期刊論文

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