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|標題:||Temperature dependence of the grain boundary segregation of Bi in Ni polycrystals||作者:||Chang, L.S.
|關鍵字:||grain boundary segregation;Ni-Bi alloys;segregation modeling;AES;cu(bi) alloys;penetration;bismuth;nickel;embrittlement||Project:||Scripta Materialia||期刊/報告no：:||Scripta Materialia, Volume 51, Issue 6, Page(s) 551-555.||摘要:||
The grain boundary segregation of Bi in Ni polycrystals doped with Bi and annealed at 400-1000degreesC was investigated by Auger electron spectroscopy (AES). In the Ni-50 wt. ppm Bi alloy the amount of Bi segregation at grain boundaries decreases continuously with increasing temperature. Abrupt changes of segregation were observed in Ni-90 wt. ppm Bi and Ni-160 wt. ppm Bi alloys between 400-500 and 900-1000degreesC, respectively. (C) 2004 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
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