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|標題:||Modifying exchange bias effects of Mn/NiFe bilayers by in-situ Ar+ bombardment||作者:||G.L. Causer
J. van Lierop
|關鍵字:||Magnetism;Thin films;Exchange bias;Ion-bombardment||出版社:||NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS||Project:||Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Volume 409, 15 October 2017, Pages 121-125||摘要:||
In this work, we present a procedure to modify the exchange bias (EB) properties of antiferromagnetic Mn/ferromagnetic NiFe bilayers by in-situ low energy Ar+ bombardment of the Mn layer during sample deposition. We present structural and magnetic results for unassisted and Ar+ assisted Mn/NiFe bilayers. X-ray diffraction, transmission electron microscopy and electron diffraction results establish different preferred Mn orientation directions between the two samples as a result of the Ar+ bombardment process. Hysteresis loops taken over several temperatures reveal that samples assisted with Ar+ ions during the Mn layer deposition had suppressed EB properties at low temperature as compared to samples grown without Ar+ assistance.
|Appears in Collections:||材料科學與工程學系|
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