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標題: Characterization and Fabrication of Nickel and Nickel Oxide Nanowires using Aluminum Oxide as Templates
作者: 陳秋傑
關鍵字: Nanowires;奈米金屬線;Nickel;Nickel Oxide;annealing;Aluminum Oxide;electrodeposition;NiO;Ni2O3;鎳;氧化鎳;退火;氧化鋁;電解沈積
出版社: 材料工程學研究所
由於奈米材料技術(nanomaterial technology)應用於光學(optical)、生物工程(bioengineering)、微電子元件(micro-electronic element)或半導體(semi-conductor)等科技上均有良好的發展潛能。近年來文獻中多提及其製造(fabrication)技術,其中大部份以半導體技術為製程,製程中要求高真空度,昂貴的儀器設備,而且製程時間甚長,相對地使奈米材料(元件)於量產上受到了限制。
本論文所涵蓋使用之分析技術有:(1)場發射式電子顯微鏡(Field Emission Scanning Electron Microscopy ; FESEM)研究表面形態、(2)穿透式電子顯微鏡(Transmission Electron Microscopy;TEM)研究線材的形貌﹑缺陷以及形成晶格、(3)X光繞射儀(X-ray Diffractometer ; XRD)測定晶體結構。

Nanomaterial technology, owing to the applications of optical, bioengineering, micro-electronic elements, and semi-conductor technology, has good potential applications in the future generation of nanodevices. There are many methods involved in the fabrication for nanomaterials especially in the semiconductor processes in recent years. However, high vacuum, expensive equipment and fabrication time were taken into consideration. This study offers a simple method to produce the metal nanowires. The high pure aluminum prepared by thermal vapor deposition was formed as the ordered nanochannels using aluminum anodic oxidation process. And they were used as templates materials to synthesize the metal nanowire by electordeposition.
The mechanism of nanopores and nanowires has not been clearly understood. In this work, we will utilize the electrochemical methods to study the reactions between the substrate and oxide layer interface. Optimal voltage and time have been made to fabricate the uniform diameters, depths and dispersion of nanopores. Furthermore, using thermodynamic and diffusion principles discovers the forming mechanism of the nanopores.
The analysis techniques were used in this work are: (1)Field Emission Scanning Electron Microscopy(FESEM)for observation the surface morphologies;(2)Transmission Electron Microscopy (TEM) for observing the surface morphologies, defects and crystal structures;(3)X-ray Diffraction(XRD)for determining the crystal structure.
Appears in Collections:材料科學與工程學系

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